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Joint Test Action Group
Results: 911

#	Item
641	Benefits of board and system level memory cluster test with IEEE P1581 Heiko Ehrenberg, GOEPEL Electronics Kenneth P. Parker, Agilent Technologies Bradford Van Treuren, Lucent Technologies Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-03-20 12:52:22 Electronics Technology Computer memory Boundary scan Standards organizations Joint Test Action Group Dynamic random-access memory Institute of Electrical and Electronics Engineers Memory controller Electronics manufacturing Manufacturing IEEE standards
642	What is happening with IEEE P1581? Heiko Ehrenberg P1581 working group chair GOEPEL Electronics What is happening with IEEE P1581? Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-12-12 13:59:44 Electronics Boundary scan Technology Joint Test Action Group ATML XSBI IEEE standards Electronics manufacturing Manufacturing
643	Microsoft PowerPoint - MEMTestIssuesFinal.ppt Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-03-20 12:53:04 Electronic engineering DDR SDRAM Synchronous dynamic random-access memory Field-programmable gate array DDR2 SDRAM Dynamic random-access memory Application-specific integrated circuit Joint Test Action Group SDRAM Electronics Computer hardware
644	Document No.: FT_000288 FT232H SINGLE CHANNEL HI-SPEED USB TO MULTIPURPOSE UART/FIFO IC Datasheet Version 1.8 Clearance No.: FTDI #199 Future Technology Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-12-18 18:24:22 Microcontrollers USB Data transmission Universal asynchronous receiver/transmitter Universal Serial Bus RS-232 USB flash drive Serial port Joint Test Action Group Computer hardware Computing Electronics
645	FTDI Introduces New USB Controller Series Optimising Designers’ Implementation Choices Delivering maximum flexibility to USB implementations by targeting standard drivers & adding battery charger detection feature Fut Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-10-02 11:31:27 Electronics Universal Serial Bus USB flash drive FTDI Joint Test Action Group Microcontrollers EXtensible Host Controller Interface USB human interface device class Computer hardware USB Technology
646	Arria 10 Core Fabric and General Purpose I/Os Handbook Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-08-15 08:54:23 Electronics manufacturing Embedded systems Manufacturing Altera Joint Test Action Group Arria Electronic engineering Electronics Field-programmable gate array
647	Breakthrough silicon scanning discovers backdoor in military chip (DRAFT of 05 March[removed]Sergei Skorobogatov Christopher Woods Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2012-05-28 09:08:30 Electronics manufacturing Manufacturing IEEE standards Microcontrollers Joint Test Action Group Power analysis Boundary scan Field-programmable gate array TI MSP430 Electronics Electronic engineering Embedded systems
648	New USB to Digital Level Interface Cabling Solutions from FTDI Targeted at home appliance, industrial control, JTAG & healthcare markets USB solutions specialist Future Technology Devices International Limited (FTDI) has Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-06-18 06:43:37 Embedded systems USB Universal Serial Bus USB flash drive FTDI Joint Test Action Group Microcontrollers Bus Pirate Total Phase Computer hardware Electronics Technology
649	VoteBox Nano: A Smaller, Stronger FPGA-based Voting Machine (Short Paper) Ersin Öksüzo˘glu† Dan S. Wallach‡ [removed] Add to Reading List Source URL: accurate-voting.org Language: English - Date: 2013-06-05 15:32:08 Embedded systems Field-programmable gate array Joint Test Action Group Reconfigurable computing MicroBlaze Xilinx Hardware random number generator Booting Electronic voting Electronic engineering Computer hardware Electronics
650	Embedded World - Hall 12.0 , Stand[removed]Single Channel Hi-Speed USB to UART/FIFO Interface IC for Next Generation Peripheral Design With the ability to be placed in various serial & parallel I/O configurations, includ Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-06-18 06:43:08 Universal Serial Bus FTDI Universal asynchronous receiver/transmitter Joint Test Action Group USB RS-232 Atmel AVR Bus Pirate Electronics Technology Computer hardware

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